William R. Wiley Environmental Molecular Sciences Laboratory (EMSL) Users now able to Remotely Analyze Data from the Ultra-High Resolution X-ray Photoelectron Spectrometer and the Time-of-Flight Secondary Ion Mass Spectrometer

Summary

EMSL users from several universities are now remotely using the Phi Multi-Pak software analysis program to analyze data from the EMSL’s time-of-flight secondary ion mass spectrometer (TOF-SIMS), and from the ultra-high resolution x-ray photoelectron spectrometer. Phi Multi-Pak was originally purchased for use with the x-ray photoelectron spectrometer, but EMSL staff adapted this commercial software package to work on the TOF-SIMS. This adaptation expands the EMSL’s collaboratory capabilities to new instruments and allows users to perform their own data analysis rather than rely on EMSL staff.